Characterization


  • XRD Measurement System
  • PL Mapping System
  • ECV
  • Sheet Rezistance
  • Hall Effect Measurement System (HEMS)
  • Ellipsometer
  • SEM
  • Spectrophotometer
  • Probe-station
  • Profilmeter
  • Optical Microscope
  • LIV Measurement
© Copyright 2024 EON PHOTONICS - by ERMAKSAN